Journal
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS
Volume 42, Issue 7B, Pages L866-L868Publisher
JAPAN SOC APPLIED PHYSICS
DOI: 10.1143/JJAP.42.L866
Keywords
Talbot effect; hard X-rays; radiography; interferometry; differential phase
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First Talbot interferometry in the hard X-ray region was demonstrated using a pair of transmission gratings made by forming gold stripes on glass plates. By aligning the gratings on the optical axis of X-rays with a separation that caused the Talbot effect by the first grating, moire fringes were produced inclining one grating slightly against the other around,the optical axis. A phase object placed in front of the first grating was detected by moire-fringe bending. Using the technique of phase-shifting interferometry, the differential phase corresponding to the phase object could also be measured. This result suggests that X-ray Talbot interferometry is a novel and simple method for phase-sensitive X-ray radiography.
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