Journal
ULTRAMICROSCOPY
Volume 96, Issue 3-4, Pages 535-546Publisher
ELSEVIER
DOI: 10.1016/S0304-3991(03)00114-1
Keywords
HREELS; bandgap; near edge structures; GaN; TiO2 (brookite)
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New experiments made possible with a commercial transmission electron microscope (TEM) equipped with a high-resolution electron energy loss spectrometer (EELS) are presented. With this commercial system, a 100 meV energy resolution using a sub 2 nm probe or 500 meV at a 0.20 nm probe are possible, in combination with other modern techniques available for TEMs. In this paper a number of explorative examples of the first results are shown. The benefit of the increased resolution for detecting more details in near edge structures are shown for the Ti K edge in TiO2 (brookite) and for the N K edge in cubic and hexagonal GaN. The bandgap of GaN is studied in both crystal structures, as well as the dependency of the low-loss spectrum on the momentum transfer direction in diffraction mode. (C) 2003 Elsevier B.V. All rights reserved.
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