Journal
ULTRAMICROSCOPY
Volume 96, Issue 3-4, Pages 313-322Publisher
ELSEVIER
DOI: 10.1016/S0304-3991(03)00096-2
Keywords
STEM; aberration; Cs-correction; EELS; localization; delocalization; coherence
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The degree of information localization in elastic and inelastic scattering is examined in the context of imaging zone axis crystals in the aberration corrected STEM. We show that detector geometry is a critical factor in determining the localization, and compare a number of different geometries. Experimental core loss line traces demonstrate strong EELS localization at the titanium L-edge, even in the presence of dynamical elastic scattering. (C) 2003 Elsevier Science B.V. All rights reserved.
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