Journal
JOURNAL OF APPLIED PHYSICS
Volume 94, Issue 5, Pages 3549-3555Publisher
AIP Publishing
DOI: 10.1063/1.1597974
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We show that time-resolved photoluminescence measurements of completed polycrystalline CdTe solar cells provide a measure of recombination near the CdTe/CdS metallurgical interface that is strongly correlated to the open-circuit voltage in spite of complex carrier dynamics in the junction region. Oxygen in the growth ambient during close-spaced sublimation generally reduces this recombination rate; grain size does not have a strong effect. (C) 2003 American Institute of Physics.
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