Journal
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS
Volume 42, Issue 9A, Pages 5465-5471Publisher
JAPAN SOC APPLIED PHYSICS
DOI: 10.1143/JJAP.42.5465
Keywords
ZnO; photoreflectance; fundamental absorption edge; critical point; temperature dependence
Categories
Ask authors/readers for more resources
Photoreflectance (PR) measurements have been carried out to determine the fundamental-absorption-edge (E-0) structure of ZnO for light polarization E perpendicular (E perpendicular to c) and parallel to the c-axis (E parallel to c) at temperatures T between 15 and 300 K. The measured PR spectra revealed distinct structures at similar to3.3-3.5 eV. These structures could be successfully interpreted using the three-dimensional (3D) excitonic plus one-electron line shapes over the entire temperature range. The temperature dependence of the 3D critical-point and excitonic parameters (energy, amplitude and broadening parameter) has also been determined and analyzed using the Varshni equation and an analytical four-parameter expression recently developed for the explanation of the band-gap shrinkage effect in semiconductors. The 3D-exciton binding energies were determined to be 65 (A), 68 (B) and 63 meV (C), respectively.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available