4.5 Review

Microstructural evolution during film growth

Journal

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
Volume 21, Issue 5, Pages S117-S128

Publisher

A V S AMER INST PHYSICS
DOI: 10.1116/1.1601610

Keywords

-

Ask authors/readers for more resources

Atomic-scale control and manipulation of the microstructure of polycrystalline thin films during kinetically limited low-temperature deposition, crucial for a broad range of industrial applications, has been a leading goal of materials science during the past decades. Here, we review the present understanding of film growth processes-nucleation, coalescence, competitive grain growth, and recrystallization-and their role in microstructural evolution as a function of deposition variables including temperature, the presence of reactive species, and the use of low-energy ion irradiation during growth. (C) 2003 American Vacuum Society.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.5
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available