Journal
IEEE TRANSACTIONS ON MAGNETICS
Volume 39, Issue 5, Pages 3208-3210Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMAG.2003.816149
Keywords
anomaly factor; domain structure; grain size; nonoriented Si-Fe electrical sheets
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Domain configuration of the nonoriented Si-Fe electrical sheets with different grain size was observed decreasing their sheet thickness by using the Kerr effect. It was found that the nonoriented sheet needs multiple grains in the sheet thickness direction to eliminate the normal magnetization component in the flux closing structure causing excessive eddy current loss.
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