Journal
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
Volume 42, Issue 9AB, Pages L1073-L1076Publisher
INST PURE APPLIED PHYSICS
DOI: 10.1143/JJAP.42.L1073
Keywords
carbon nanofilm; HRTEM; ED; structure analysis; thickness; stacking sequence; EELS; O/C; semiconductor
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We have prepared a carbon film of nanometer thickness, which is called here a carbon nanofilm (CNF), starting from the oxidation of graphite. The structure and thickness of the CNF are determined by high-resolution transmission electron microscopy and electron diffraction. The structure is of a new type (S.G.: P3), in which carbon six-membered-ring planes are stacked with the sequence of... AA.... According to electron energy loss spectroscopy, a substantial amount of oxygen is detected but the molar ratio of oxygen to carbon is possibly decreased to less than 0.1. The CNF changes from an insulator to a semiconductor when reduced on heating at 250degreesC.
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