Journal
OPTICS EXPRESS
Volume 11, Issue 19, Pages 2303-2314Publisher
Optica Publishing Group
DOI: 10.1364/OE.11.002303
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X-ray interferometry for imaging applications is discussed with a review of X-ray interferometric imaging activities reported to date. Phase measurement and phase tomography based on X-ray interferometry are also presented. Finally the advantage of X-ray interferometric imaging in comparison with other phase-sensitive X-ray imaging methods is discussed. (C) 2003 Optical Society of America
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