Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volume 211, Issue 2, Pages 259-264Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/S0168-583X(03)01321-1
Keywords
micro-XRF; depth profiling of elemental composition; paint layers
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A new 3D micro X-ray fluorescence (micro-XRF) analysis method based on a confocal X-ray set-up is presented. The capabilities of this new method are evaluated and illustrated with depth sensitive investigations of paint layers in ancient Indian Mughal miniatures. Successive paint layers could be distinguished non-destructively with a depth resolution of about 10 mum. Major and minor elements are detectable and can be discriminated in different layers. New light could be shed on ancient painting techniques and materials with this new 3D micro-XRF set-up. (C) 2003 Elsevier B.V. All rights reserved.
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