Journal
APPLIED PHYSICS LETTERS
Volume 83, Issue 14, Pages 2925-2927Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1616651
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The probing depth of photoelectron emission microscopy has been determined for photon excitation energies of 5 eV. For Ag overlayers deposited on Fe, it is found that the probing depth is extremely large; that is, 16.2 nm. This result is compared with probing depths of related techniques, and the physical mechanisms responsible for this bulk sensitivity are discussed. (C) 2003 American Institute of Physics.
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