4.4 Article

Defect lines and two-domain structure of hexagonal boron nitride films on Ni(111)

Journal

SURFACE SCIENCE
Volume 545, Issue 1-2, Pages L735-L740

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.susc.2003.08.046

Keywords

scanning tunneling microscopy; photoelectron diffraction; nickel; boron nitride; surface defects

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The growth of hexagonal boron nitride (h-BN) on Ni(1 1 1) at submonolayer coverages results in triangular islands with two different orientations. In combining X-ray photoelectron diffraction and scanning tunneling microscopy it is demonstrated that these two island types correspond to fcc and hcp domains of h-BN/Ni(1 1 1). The domain boundaries appear as defect lines that are also present in complete h-BN monolayers. Based on the experimental data, structural models for the two domains and the defect lines are discussed. (C) 2003 Elsevier B.V. All rights reserved.

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