4.6 Article

Chemical imaging of interfaces by sum-frequency generation microscopy: Application to patterned self-assembled monolayers

Journal

APPLIED PHYSICS LETTERS
Volume 83, Issue 18, Pages 3830-3832

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.1624465

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We demonstrate molecule-specific imaging of a chemically patterned self-assembled monolayer by IR-visible sum-frequency microscopy. The pattern on an Au substrate consists of microcontact printed 10 mum wide alkanethiolate stripes embedded in omega-carboxyalkanethiolate adsorbed from solution. We use both electronic and vibrational contrast mechanisms for a quantitative analysis of thiolate density and the coverage of the two molecular species. The evaluation of images taken at three different IR wavelengths suggests a substantial intermixing of the two thiolates occuring in the preparation procedure. (C) 2003 American Institute of Physics.

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