Environmental effects in the third moment of voltage fluctuations in a tunnel junction

We present the first measurements of the third moment of the voltage fluctuations in a conductor. This technique can provide new and complementary information on the electronic transport in conducting systems. The measurement was performed on nonsuperconducting tunnel junctions as a function of voltage bias, for various temperatures and bandwidths up to 1 GHz. The data demonstrate the significant effect of the electromagnetic environment of the sample.