4.6 Article

High-incident photon-to-current conversion efficiency by sulfurization of wide-band gap metal oxides

Journal

MATERIALS CHEMISTRY AND PHYSICS
Volume 82, Issue 2, Pages 466-470

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/S0254-0584(03)00273-6

Keywords

wide-band gap metal oxides; sulfurization; micro-crystals of sulfides; semiconductor sensitization

Ask authors/readers for more resources

Sulfurization of some wide-band gap metal oxides forms photoactive sulfides on metal oxide electrodes. Very high-incident photon-to-current conversion efficiencies are achieved on In2S3/In2O3, Bi2S3/Bi2O3, and MgIn2S4/MgIn2O4 electrodes in a polysulfide electrolyte. Semiconductor sensitization is responsible for the generation of the photocurrent on those electrodes. A semiconductor sensitization process was not observed on ZnS/ZnO electrodes. Different kinetics at the semiconductor/semiconductor interface are the reasons for the observed difference of the incident photon-to-current conversion efficiency, for the electrodes. (C) 2003 Elsevier B.V. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available