Journal
APPLIED PHYSICS LETTERS
Volume 83, Issue 21, Pages 4297-4299Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1626020
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We measured the dynamic I-V characteristics and vacuum ultraviolet (VUV) emission lines of the second continuum in xenon (170 nm) and argon (130.5 nm) from pulsed microhollow cathode discharges (MHCD). For pulse lengths between 1 and 100 mus the dynamic I-V characteristics are similar in both inert gases. Only the time variation of the VUV emission line at 170 nm for xenon can be related to the dimer excited states. In argon the energy transfer between the Ar-2(*) dimers and the oxygen impurity atoms is responsible for a qualitatively different time behavior of the resonance line at 130.5 nm. Consequently, the relative VUV efficiency reveals an inverse dependence on the electrical pulse lengths for the MHCD in xenon and argon, respectively. (C) 2003 American Institute of Physics.
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