Simple, sensitive nitrogen analyzer based on pulsed miniplasma source emission spectrometry

The development of pulsed miniplasma source emission spectrometry for trace nitrogen determination in inert gases is described in this article. The instrument consists of a pulsed miniplasma source generated by an in-house fabricated portable high-voltage supply, an optical beam collection system, an integrated small spectrometer with a charge-coupled-device detector, an interface card, and a notebook computer for controlling spectrometer parameters and signal processing. Trace nitrogen in the inert gases, such as helium and argon, was determined by monitoring the emission intensities from nitrogen molecules at 357 and 337 nm. The analytical performance was examined under various experimental conditions. The system has a detection limit of about 15 ppb (v/v) for nitrogen in helium with a relative standard deviation of 1.5%. The newly developed instrument offers a simple, low-cost, and sensitive method for continuously monitoring trace nitrogen in high-purity inert gases. (C) 2003 American Institute of Physics.