4.6 Article

Crystal structure refinement of the semiconducting compound Cu2SnSe3 from X-ray powder diffraction data

Journal

MATERIALS RESEARCH BULLETIN
Volume 38, Issue 15, Pages 1949-1955

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.materresbull.2003.09.017

Keywords

semiconductors; X-ray diffraction; crystal structure

Ask authors/readers for more resources

The semiconducting compound Cu2SnSe3 has been investigated by means of X-ray powder diffraction and its structure has been refined by the Rietveld method. The compound crystallizes in the monoclinic space group Cc (C-s(4), No. 9), Z = 4, with unit cell parameters a = 6.9670(3) Angstrom, b = 12.0493(7) Angstrom, c = 6.9453(3) Angstrom, beta = 109.19(1)degrees, and V = 550.6(5) Angstrom(3). The refinement of 36 instrumental and structural parameters converged to R-p, = 6.1%, R-wp = 8.6%, R-exp = 5.7%, R-B = 6.4%, S = 1.5, for 4501 step intensities and 280 independent reflections. The structure of Cu2SnSe3 can be described as an adamantane compound derivative of the sphalerite structure. (C) 2003 Elsevier Ltd. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available