Apertureless near-field optical microscopy: Tip-sample coupling in elastic light scattering

For linear light scattering in apertureless scanning near-field optical microscopy, we have studied the correlations between the tip radius of the probe, signal strength, spatial resolution, and sample material. Pronounced variations of the near-field distance dependence on tip shape and dielectric function of the sample are observed. For very sharp metal tips, the scattered near-field signal decays on a 5 nm length scale. Despite this highly localized tip-sample coupling, the contrast is found to depend sensitively on the vertical composition of the sample on a length scale given by the penetration depth of the incident light. The resulting implications on the use of the technique as an analytic probe method are discussed. (C) 2003 American Institute of Physics.