Journal
JOURNAL OF NON-CRYSTALLINE SOLIDS
Volume 333, Issue 2, Pages 206-211Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.jnoncrysol.2003.09.045
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Transmission and fundamental reflectivity studies, completed on amorphous Cd-As thin films, allowed us to obtain parameters describing the fundamental absorption edge, i.e. the optical pseudogap E-G(opt), Urbach energy E-U and exponential edge parameter E-T. G All these data, together with the results of earlier transport measurements, have been utilized in developing simple models of electronic structure (distribution of electronic states) for amorphous Cd-As thin films of various compositions. (C) 2003 Elsevier B.V. All rights reserved.
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