Probing nanoscale dipole-dipole interactions by electric force microscopy -: art. no. 166101

We address the issue of dipole-dipole interaction measurements at the nanometer scale. Electric dipoles with tunable effective momentum in the range 10(3)-10(4) D are generated by charge injection in single silicon nanoparticles on a conductive substrate and probed by a spectroscopic electric force microscopy analysis. Weak dipole-dipole force gradients are measured and identified from their quadratic momentum dependence. The results suggest that dipolar interactions associated with atomic-scale charge displacements or molecules can be probed by noncontact atomic force microscopy.