Journal
THIN SOLID FILMS
Volume 455, Issue -, Pages 619-623Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2003.11.207
Keywords
dielectric functions; band-to-band transitions; phonon modes; anisotropy; generalized ellipsometry; stibnite
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Generalized ellipsometry allows complete extraction of the dielectric function tensor, including orientation, from measurement of skew-cut single crystal orthorhombic absorbing materials. As an example, Stibnite (Sb2S3) is studied to determine fundamental phonon modes and band-to-band transitions, which are here provided for polarization along axes a, b, and c from lineshape analysis of the major dielectric function spectra. (C) 2003 Elsevier B.V. All rights reserved.
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