☆ 4.5 Article Proceedings Paper

Correlation between the electrical properties and the interfacial microstructures of TiAl-based ohmic contacts to p-type 4H-SiC

JOURNAL OF ELECTRONIC MATERIALS (2004)

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Correlation between the electrical properties and the interfacial microstructures of TiAl-based ohmic contacts to p-type 4H-SiC

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