4.4 Article

Structural investigations of synthetic ferrihydrite nanoparticles doped with Si

Journal

SOLID STATE COMMUNICATIONS
Volume 130, Issue 9, Pages 597-601

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.ssc.2004.03.022

Keywords

nanostructures; structural and characterization

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X-ray diffraction (XRD), transmission electron microscopy (TEM), and photoacoustic/Fourier transform infrared spectroscopy (PA/FTIR) are employed to monitor the changes in the structural aspects of two-line ferrihydrite (FHYD) nanoparticles doped with silica viz. SixFe1 xOOH.nH(2)O for x = 0, 0.02, 0.05, 0.10, 0.15, 0.20, 0.26, 0.40 and 0.50. In XRD, crystallinity decreases and d-spacings increase with increase in x. TEM studies show that the particle size increases systematically with increase in x, from 3.7 nm for x = 0 to 5.7 nm for x = 0.50. In PA/FTIR, two new bands appear, band F near 3700 cm(-1) identified with the surface Si-O-H group and band A near 900 cm(-1) identified with Si-O-Fe group, which shifts to higher wavenumbers with increase in x. These results are used to propose a model in which doped Si4+ ions do not displace Fe3+ ions but are chemisorbed on the FHYD surface making a shell of silica for higher doping. This model is consistent with the reported changes in the magnetic properties of FHYD with Si doping. (C) 2004 Published by Elsevier Ltd.

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