Journal
OPTICS LETTERS
Volume 29, Issue 12, Pages 1312-1314Publisher
OPTICAL SOC AMER
DOI: 10.1364/OL.29.001312
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We identify two states of stress induced in waveguides fabricated by femtosecond lasers in fused silica and show how they can be relieved by annealing. In-plane stress and stress concentration are revealed through birefringence and loss measurements. Another kind of laser-induced stress appears in the form of swelling of the glass surface when waveguides are written near the surface and is a manifestation of confined rapid material quenching. By annealing the sample we reduce the losses by similar to30% (at 633 nm) and decrease the birefringence by a factor of 4 in fused silica. (C) 2004 Optical Society of America.
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