4.1 Article Proceedings Paper

High-resolution XES and RIXS studies with a von Hamos Bragg crystal spectrometer

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Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.elspec.2004.02.005

Keywords

high-resolution X-ray spectrometer; XES; RIXS; atomic-level widths; double photoexcitation

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The high-resolution von Hamos Bragg crystal spectrometer was constructed for the study of K X-ray emission from low-Z elements and L and M X-ray spectra of medium to high Z elements. Recently, this instrument was applied to high-resolution XES and RIXS studies using X-ray synchrotron radiation at the ID21 and BM5 beamlines at the ESRF. An outline of the spectrometer design and performance characteristics will be given. The studies deal with the energy dependent KL double photoexcitation of argon, the L-3 and M-1 atomic-level widths of elements 54 less than or equal to Z less than or equal to 77, and the evolution of the K-edge RIXS spectra of manganese oxides. (C) 2004 Elsevier B.V. All rights reserved.

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