Journal
JOURNAL OF ELECTROCERAMICS
Volume 13, Issue 1-3, Pages 605-608Publisher
SPRINGER
DOI: 10.1007/s10832-004-5165-0
Keywords
nanocrystalline ceramics; mechanical stress; diffusion; cerium oxide
Categories
Ask authors/readers for more resources
The temporal evolution of the lattice parameter of oxygen deficient nanocrystalline cerium oxide films was monitored by X-ray diffraction. It was found that films with lattice parameter of approximate to5.47 Angstrom upon deposition undergo large spontaneous expansion, in which the size of the unit cell increases by approximate to0.7% during the course of days. The films with as-deposited lattice parameter larger or smaller than approximate to5.47 Angstrom do not show significant changes. This behavior is consistent with the previously suggested hypothesis of an order-disorder transition of oxygen vacancies and can be viewed as its direct experimental confirmation.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available