4.7 Article

Synthesis and surface properties of polyamide-CuxSe composite thin films

Journal

APPLIED SURFACE SCIENCE
Volume 283, Issue -, Pages 360-366

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.apsusc.2013.06.116

Keywords

Copper selenide; Adsorption-diffusion; XPS; XRD

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A study of copper selenide (CuxSe) thin film deposition on PA 6 polymer surface via adsorption/diffusion method and the resulting surface properties is presented. A two stage process used to deposit these thin films involves (a) selenization in 0.1 M K2SeS2O6 at pH 2.15 and 60 degrees C followed by (b) treatment with 0.34 M Cu(II) and 0.06 M Cu(I) salt solution at 80 degrees C. Resulting chemical and physical properties of CuxSe films were investigated using XRD, XPS, SEM and sheet resistivity measurements. XRD data showed a complex mixture of CuxSe phases with peaks due to the elemental Se present at longer exposures. Thin film bulk elemental composition varied with the exposure time whereas XPS analysis showed surface to be slightly copper enriched. Additionally, mostly Cu-Se bonds were observed on the surface with minor oxidation products. SEM crossectional analysis showed distinct CuxSe film formation on PA 6 surface with thickness of similar to 1-5 mu m. Finally, it was found that sheet resistance of 150 +/- 10 Omega/square was achieved after 120 min of selenization for all samples and remained constant after longer exposures. (c) 2013 Elsevier B.V. All rights reserved.

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