Journal
APPLIED SURFACE SCIENCE
Volume 261, Issue -, Pages 547-553Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.apsusc.2012.08.053
Keywords
LiF thin film; Height-height correlation; MFDFA; Fractal analysis; Multifractal analysis
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Funding
- UGC-CSIR
- DST/MoES/ISRO
- DST
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Fractal and multifractal analysis is performed on the atomic force microscopy (AFM) images of the surface morphologies of the LiF thin films of thickness 10 nm, 20 nm, and 40 nm, respectively. Autocorrelation function, height-height correlation function, and two-dimensional multifractal detrended fluctuation analysis (MFDFA) are used for characterizing the surface. It is found that the interface width, average roughness, lateral correlation length, and fractal dimension of the LiF thin film increase with the thickness of the film, whereas the roughness exponent decreases with thickness. Thus, the complexity and roughness of the LiF thin films increases as thickness increases. It is also demonstrated that the LiF thin films are multifractal in nature. Strength of the multifractality increases with thickness of the film. (C) 2012 Elsevier B. V. All rights reserved.
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