Journal
APPLIED SURFACE SCIENCE
Volume 258, Issue 17, Pages 6281-6287Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.apsusc.2012.03.022
Keywords
MAX phase; Ion irradiation; X-ray diffraction
Categories
Funding
- National Nature Science Foundation of China [10975035]
- Chinese special project for ITER [2010GB104002]
- Department of Industry, Innovation and Science Research, Australian Government [CH080126]
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The microstructure of high fluence 2 MeV I2+ irradiated Ti3SiC2 has been studied by grazing incident Xray diffraction (GIXRD) using synchrotron radiation. The shift and broadening of the observed diffraction peaks are due to a variety of defects ranging from atomic to micron scale in size. The observation of the surface micrograph reveals the microcrack formation at grain boundaries due to high irradiation damage. The Raman spectrum of Ti3SiC2 was measured and compared with that of TiC0.67. It was found that a TiC nanocrystalline phase was formed under the high dose irradiation. However, a complete decomposition by irradiation did not take place even at 10.3 dpa. Post irradiation annealing to temperatures of 500-800 degrees C results in crystal regrowth of Ti3SiC2 and TiC phases. (C) 2012 Elsevier B.V. All rights reserved.
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