Journal
MATERIALS LETTERS
Volume 58, Issue 17-18, Pages 2266-2269Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.matlet.2004.01.030
Keywords
thin film; X-ray diffraction; self-assembled; nanocomposite; SiO2; nacre-like
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The SiO2/Poly(DMCB) nanocomposite thin films were prepared by supermolerculer self-assembly method on glass substrate. In the nanocomposite thin films, the surfactant DMCB was used as both structure-directing agents and poly monomers. The structures of the films were characterized using FT-IR, XRD and TEM. The results indicated that the films were composed of organic and inorganic layers with orderly interlaced arrangement and the distance between organic layer and inorganic layer was 3.48 nm before polymerization and 2.84 nm after polymerization, respectively. (C) 2004 Elsevier B.V. All rights reserved.
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