4.7 Article

Fabrication of nested elliptical KB mirrors using profile coating for synchrotron radiation X-ray focusing

Journal

APPLIED SURFACE SCIENCE
Volume 258, Issue 6, Pages 2182-2186

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.apsusc.2011.02.079

Keywords

Profile coating; X-ray optics; KB mirrors; Sputter deposition

Funding

  1. UChicago Argonne, LLC, Operator of Argonne National Laboratory (Argonne)
  2. Argonne, a U.S. Department of Energy Office of Science laboratory [DE-AC02-06CH11357]
  3. Center for Defect Physics an Energy Frontier Research Center
  4. U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences [ERKCS99]

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This paper describes fabrication methods used to demonstrate the advantages of nested or Montel optics for micro/nanofocusing of synchrotron X-ray beams. A standard Kirkpatrick-Baez (KB) mirror system uses two separated elliptical mirrors at glancing angles to the X-ray beam and sequentially arranged at 90 degrees to each other to focus X-rays successively in the vertical and horizontal directions. A nested KB mirror system has the two mirrors positioned perpendicular and side-by-side to each other. Compared to a standard KB mirror system, Montel optics can focus a larger divergence and the mirrors can have a shorter focal length. As a result, nested mirrors can be fabricated with improved demagnification factor and ultimately smaller focal spot, than with a standard KB arrangement. The nested system is also more compact with an increased working distance, and is more stable, with reduced complexity of mirror stages. However, although Montel optics is commercially available for laboratory X-ray sources, due to technical difficulties they have not been used to microfocus synchrotron radiation X-rays, where ultra-precise mirror surfaces are essential. The main challenge in adapting nested optics for synchrotron microfocusing is to fabricate mirrors with a precise elliptical surface profile at the very edge where the two mirrors meet and where Xrays scatter. For example, in our application to achieve a sub-micron focus with high efficiency, a surface figure root-mean-square (rms) error on the order of 1 nm is required in the useable area along the X-ray footprint with a similar to 0.1 mm-diameter cross section. In this paper we describe promising ways to fabricate precise nested KB mirrors using our profile coating technique and inexpensive flat Si substrates. (C) 2011 Elsevier B.V. All rights reserved.

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