Journal
APPLIED SURFACE SCIENCE
Volume 257, Issue 12, Pages 5398-5402Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.apsusc.2010.11.022
Keywords
Zinc oxide; Thin film; Gas sensor; UV irradiation; Crystallinity; X-ray diffraction (XRD)
Categories
Funding
- National Science Foundation (NSF) of USA [CMMI 0933069]
- Department of Physics at the University of Louisville
- Directorate For Engineering
- Div Of Civil, Mechanical, & Manufact Inn [0933069] Funding Source: National Science Foundation
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The effect of ultraviolet (UV) light irradiation on the nanocrystalline ZnO thin films was investigated. The degree of crystallinity, electrical conductivity, optical properties and surface properties of ZnO thin films were measured as a function of UV irradiation time. It was found that the degree of crystallinity and electrical properties of ZnO films were affected by UV irradiation, however, no noticeable change in the surface morphology was observed. The gas sensing properties of as-deposited and UV irradiated films were also measured. It was observed that the gas sensing properties were affected by the UV irradiation. The irradiation time less than 5 min has improved the sensor while the irradiation time more than 5 min degraded the sensor characteristics for a UV power density of 2.45 Wcm(-2). (C) 2010 Published by Elsevier B.V.
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