Journal
APPLIED SURFACE SCIENCE
Volume 257, Issue 8, Pages 3205-3210Publisher
ELSEVIER
DOI: 10.1016/j.apsusc.2010.10.140
Keywords
Switching effect; Memory; Crystal growth; TlGaS2
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Single crystals of TlGaS2 were prepared by a special modified Bridgman technique and used to investigate the switching phenomena. The particular interest shown in switching studies of p-type TlGaS2 compound is associated with the possibility of its uses as an effective switching and memory elements in electronic devices. The switching effect observed in such crystal shows a memory character. Using a crystal holder and cryostat we measured the switching phenomenon at different ambient conditions such as temperature, light illumination as well as sample thickness. Pronounced parameters for switching for sample of thickness 0.17 cm were determined from the experimental data such as threshold voltage V-th = 400 V, threshold current I-th = 37 mu A, holding voltage V-h = 350 V, holding current I-h = 42.3 x 10(-4) A, threshold power P-th = 1.48 x 10(-2) W, threshold field E-th = 196.429 V/cm as well as the ratio between the resistance in the off state R-OFF to the resistance in the conducting state R-ON as 130.253. The factors affecting these parameters have also been investigated. (C) 2010 Elsevier B.V. All rights reserved.
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