Journal
OPTICS LETTERS
Volume 29, Issue 14, Pages 1617-1619Publisher
OPTICAL SOC AMER
DOI: 10.1364/OL.29.001617
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Waveguide terahertz time-domain spectroscopy is demonstrated to have the sensitivity to characterize nanometer-thick water layers on the surfaces of a parallel-plate metal waveguide. The measured far-infrared absorption and index of refraction of the 20-nm water layers are in reasonable self-consistent agreement with those of bulk water. (C) 2004 Optical Society of America.
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