Journal
ELECTROCHEMISTRY COMMUNICATIONS
Volume 6, Issue 8, Pages 853-859Publisher
ELSEVIER SCIENCE INC
DOI: 10.1016/j.elecom.2004.06.011
Keywords
cobalt-molybdenum alloy; electrodeposition; white-light interferometry; AFM; MEMS
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Cobalt molybdenum alloy containing similar to10% molybdenum, which has promising applications in magnetic devices, was deposited on silicon-based substrates. A solution containing 0.2 mol dm(-3) C6H5Na3O7 + 0.3 mol dm(-3) CoSO4 + 0.012 mol dm(-3) Na2MoO4 at pH = 4.0 and 25 degreesC was used to prepare Co-Mo coatings, which showed a soft-magnetic response. A constant deposition rate of 7.7 mum h(-1) was achieved under stirring. White-light interferometry and AFM techniques were used to measure the thickness of Co-Mo coatings, with identical results. White-light interferometry also revealed smooth surfaces. Deposition was highly selective on mask devices and deposits were crack-free up to similar to7 mum. Vertical walls and well-defined profiles of the coatings were obtained. At higher thickness cracks appeared and the Co-Mo layers detached. The stress was reduced by increasing the temperature and adding saccharine to the bath. (C) 2004 Elsevier B.V. All rights reserved.
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