4.7 Article

High mobility W-doped In2O3 thin films:: Effect of growth temperature and oxygen pressure on structural, electrical and optical properties

Journal

APPLIED SURFACE SCIENCE
Volume 254, Issue 6, Pages 1661-1665

Publisher

ELSEVIER
DOI: 10.1016/j.apsusc.2007.07.146

Keywords

semiconductor; electrical properties; thin films; indium oxide; tungsten; optical materials and properties

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Highly conducting and transparent thin films of tungsten (W)-doped indium oxide were obtained using pulsed laser deposition to study the effect of growth temperature and oxygen pressure on structural, optical and electrical properties. The transparency of the films is seen to largely depend on the growth temperature. The electrical properties, however, are found to depend strongly on both the growth temperature and the oxygen pressure. High mobility (up to 358 cm(2) V-1 S-1), low resistivity (1.1 x 10(-4) Omega cm), and relatively high transmittance (similar to 90%) tungsten-doped indium oxide films have been prepared at a growth temperature of 500 degrees C and an oxygen pressure of 1 X 10(-6) bar. (c) 2007 Elsevier B.V. All rights reserved.

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