Journal
APPLIED SURFACE SCIENCE
Volume 255, Issue 5, Pages 2845-2850Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.apsusc.2008.08.023
Keywords
Porous oxide films; Galvanoluminescence; Photoluminescence; Aluminum; Sulfamic acid
Categories
Funding
- Serbian Ministry of Science [141017]
Ask authors/readers for more resources
Atomic force microscopy (AFM) and luminescence methods (galvanoluminescence and photoluminescence) were used to characterize porous oxide films obtained by aluminum anodization in sulfamic acid solution. For the first time we measured weak galvanoluminescence during aluminum anodization in sulfamic acid and found strong influence of sample's surface pretreatment as well as anodic conditions on luminescence intensity. AFM analysis showed that the pore arrangement of porous oxide films formed in sulfamic acid by two-step anodization process at a constant voltage of 15-30 V is relatively irregular. (C) 2008 Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available