Journal
APPLIED SURFACE SCIENCE
Volume 255, Issue 4, Pages 1079-1083Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.apsusc.2008.05.149
Keywords
Sectioned rat brain; Neurons in hippocampus; Imaging ToF-SIMS; Subcellular ion images; Scanning probe microscopy; Phase shift image
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Coronal sections of unfixed rat brain samples were prepared on a. at substrate in order to reveal hippocampal formation (CA1-4 pyramidal neurons) and adjacent neocortical white matter. We demonstrate the feasibility of using surface sensitive techniques such as time-of-flight secondary ion mass spectrometry (ToF-SIMS) and scanning probe microscopy (SPM) to probe lipid distribution, as well as the subcellular features of neurons. In the same anatomical areas, the phase shift image in SPM is especially useful in revealing the cross-section of subcellular structures. We show that the phase shift images reveal distinctive subcellular features and ion images of CN and PO(2) fragments from ToF-SIMS appear to de. ne some of the subcellular features. (C) 2008 Elsevier B. V. All rights reserved.
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