Journal
APPLIED SURFACE SCIENCE
Volume 254, Issue 15, Pages 4695-4700Publisher
ELSEVIER
DOI: 10.1016/j.apsusc.2008.01.101
Keywords
swift heavy ion; nanodimensional TiO2; AFM; Raman spectroscopy; photoluminescence
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Amorphous thin films of TiO2 are irradiated by swift heavy ion (SHI) beam. Surface topography is studied by atomic force microscopy (AFM). Formation of nanosized oblate hillocks on the surface of irradiated films is investigated by AFM studies. After irradiation, amorphous to crystalline phase transition is observed in glancing angle X-ray diffraction (GAXRD) and Raman spectroscopy studies. Photoluminescence (PL)-spectroscopy is carried out for optical characterization. Threshold value necessary for emergence of hillocks is estimated. (C) 2008 Elsevier B.V. All rights reserved.
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