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JOURNAL OF APPLIED PHYSICS
Volume 96, Issue 4, Pages 1963-1966Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1772885
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The structural properties of copper selenide (CuxSe), formed as a secondary phase on the surface of CuGaSe2 films grown under Cu-rich conditions on GaAs (100) substrates, were studied by micro-Raman spectroscopy. Raman bands at 45 and 263 cm(-1), observed on crystallites dispersed on the CuGaSe2 film, are in agreement with the Raman modes of CuSe and Cu2Se. Polarization- and angular-dependent micro-Raman measurements reveal that the CuxSe-crystallites are grown with a preferential orientation on the CuGaSe2 surface. (C) 2004 American Institute of Physics.
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