Nanoscale compression of polymer microspheres by atomic force microscopy

Atomic force microscopy (AFM) was employed to probe the mechanical properties of surface-charged polystyrene microspheres with 1-12 mol% of vinylbenzyl(trimethyl)ammonium chloride (VBTA) units. On the basis of Hertz's theory of contact mechanics, compressive moduli between 1 and 2 GPa were measured by the analysis of force-displacement curves captured on the particles via the force-volume technique. The deformation of the top of the polystyrene particles by the AFM tip was used to calculate the surface modulus. The compressive moduli are slightly less than the moduli of polystyrene bulk materials. The modulus of the polystyrene microspheres increases with an increase of the VBTA content.