Journal
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS
Volume 10, Issue 5, Pages 1164-1170Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSTQE.2004.836007
Keywords
nonlinearities; nonlinear optics
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We report on the systematic, broadband characterization of the third-order nonlinearities of the commonly used reference materials: sapphire, the lead-silica glass SF-59 and pure carbon disulfide CS2. Using the z-scan technique with similar to1-ps pulses experimental data on the nonlinear refraction and two-photon absorption were obtained in the 550-1600 nm wavelength range. Theoretical treatment of spectra and scaling of the measured nonlinearities in sapphire and SF-59 glass is given using a simple Kramers-Kronig transformation-based model. Compact empirical relations are suggested.
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