Journal
APPLIED PHYSICS LETTERS
Volume 113, Issue 5, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.5025475
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Funding
- Office of Naval Research [N00014-11-1-0690]
- NSF [CCF 1408123]
- NSF
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Electrolyte-gated transistors (EGTs) based on poly(3-hexylthiophene) (P3HT) offer low voltage operation, high transconductance, good operational stability, and low contact resistance. These characteristics derive from the massive electrochemical or double layer capacitance (similar to 10-100 mu F/cm(2)) of the electrolyte layer that serves as the gate dielectric. However, electric double layer (EDL) formation at the source/electrolyte and drain/electrolyte interfaces results in significant parasitic capacitance in EGTs which degrades dynamic switching performance. Parasitic capacitance in EGTs is reduced by covering the top surfaces of the source/drain electrodes with a low-k dielectric (similar to 0.6 nF/cm(2)). The low-k dielectric blocks EDL formation on the electrode surfaces that are in direct contact with the gate electrolyte, reducing the parasitic capacitance by a factor of 10(4) and providing a route to printed P3HT EGTs on plastic operating at switching frequencies exceeding 10 kHz with 1 V supply voltages. Published by AIP Publishing.
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