Journal
APPLIED PHYSICS LETTERS
Volume 104, Issue 3, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4862755
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Funding
- National Natural Science Foundation of China [11104240, 60725413]
- 973 Program [2011CB302004, 2013CB932903]
- Jiangsu Government Scholarship for Overseas Studies
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A resistive switching memory device consisting of reduced graphene oxide and indium tin oxide as top/bottom two electrodes, separated by dielectric MoS2 nanosphere assemblies as the active interlayer, was fabricated. This device exhibits the rewritable nonvolatile resistive switching with low SET/RESET voltage (similar to 2 V), high ON/OFF resistance ratio (similar to 10(4)), and superior electrical bistability, introducing a potential application in data storage field. The resistance switching mechanism was analyzed in the assumptive model of the electron tunneling across the polarized potential barriers. (C) 2014 AIP Publishing LLC.
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