Journal
APPLIED PHYSICS LETTERS
Volume 104, Issue 24, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4884423
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Funding
- DESY [I-20120504 EC]
- Knut och Alice Wallenberg foundation
- Deutsche Forschungsgemeinschaft [FOR 1405]
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The fabrication of substrates for Surface Enhanced Raman Scattering (SERS) applications matching the needs for high sensitive and reproducible sensors remains a major scientific and technological issue. We correlate the morphological parameters of silver (Ag) nanostructured thin films prepared by sputter deposition on flat silicon (Si) substrates with their SERS activity. A maximum enhancement of the SERS signal has been found at the Ag percolation threshold, leading to the detection of thiophenol, a non-resonant Raman probe, at concentrations as low as 10(-10)M, which corresponds to enhancement factors higher than 7 orders of magnitude. To gain full control over the developed nanostructure, we employed the combination of in-situ time-resolved microfocus Grazing Incidence Small Angle X-ray Scattering with sputter deposition. This enables to achieve a deepened understanding of the different growth regimes of Ag. Thereby an improved tailoring of the thin film nanostructure for SERS applications can be realized. (C) 2014 AIP Publishing LLC.
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