Journal
PHYSICAL REVIEW LETTERS
Volume 93, Issue 10, Pages -Publisher
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevLett.93.106801
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We discuss how threshold detectors can be used for a direct measurement of the full distribution of current fluctuations and how to exploit Josephson junctions in this respect. We propose a scheme to characterize the full counting statistics from the current dependence of the escape rate measured. We illustrate the scheme with explicit results for tunnel, diffusive, and quasiballistic mesoscopic conductors.
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