Journal
APPLIED PHYSICS LETTERS
Volume 104, Issue 1, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4861469
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Funding
- Ministry of Science and Technology of China [2009CB623304]
- National Nature Science Foundation of China [51332002, 51221291]
- NSF [CMMI 1100339]
- Div Of Civil, Mechanical, & Manufact Inn
- Directorate For Engineering [1100339] Funding Source: National Science Foundation
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For a better understanding of piezoelectricity in epitaxial film systems, epitaxially grown tetragonal Pb(Zr0.3Ti0.7)(0.98)Nb0.02O3 (PNZT) thin films with three primary crystallographic orientations were studied with a focus on their piezoelectric behaviors and domain configuration. Using piezoresponse force microscopy, the (001)-oriented epitaxial films were found to show superior piezoelectric properties compared with the (110)- and (111)-oriented films. This can be attributed to the structural characteristics of the tetragonal PNZT phase after applying an electrical field. Island-distributed domain shapes were also mapped for all three orientations. (C) 2014 AIP Publishing LLC.
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