Journal
JOURNAL OF APPLIED PHYSICS
Volume 96, Issue 6, Pages 3482-3485Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1774269
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Moisture-driven crack growth was measured as a function of film thickness for a variety of low dielectric constant and ultralow dielectric constant films and a comparison of the crack driving force was made. By plotting the crack velocity versus the crack driving force, a series of universal curves was produced which showed that fracture resistance scales with the dielectric constant. (C) 2004 American Institute of Physics.
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