4.6 Article

High perpendicular magnetic anisotropy in D022-Mn3+xGe tetragonal Heusler alloy films

Journal

APPLIED PHYSICS LETTERS
Volume 104, Issue 13, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4870625

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Funding

  1. Development of Infrastructure for Normally Off Computing Technology Projects from NEDO
  2. Asahi Glass Foundation
  3. [24686001]
  4. Grants-in-Aid for Scientific Research [24686001] Funding Source: KAKEN

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We prepared D0(22)-Mn3+xGe (-0.67 <= x <= 0.35) epitaxial thin films on MgO(001) substrates with Cr(001) buffer layers and systematically investigated the dependence of their perpendicular magnetic anisotropy constant, saturation magnetization, coercivity, and tetragonal axial ratio (c/a) on their composition and substrate temperature. Single-phase D0(22) crystal structures were formed in films with compositions of 0 <= x <= 0.35, prepared at 400 degrees C. The D0(22)-Mn3Ge films exhibited perpendicular magnetization with a magnetic squareness close to unity. Performing magnetic torque measurements at an applied field of 140 kOe, we estimated a perpendicular magnetic anisotropy constant of 11.8 +/- 0.5 Merg/cm(3), the highest and the most reliable value yet reported. (C) 2014 AIP Publishing LLC.

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